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DIGITAL COMMUNICATIONS TEST AND MEASUREMENT: HIGH-SPEED PHYSICAL LAYER CHARACTERIZATION - ED 1. / 2007

Por: DERICKSON , DENNIS | [Autor].
Colaborador(es): MULLER, MARCUS.
Editor: USA ; PRENTICE HALL ; 2007Edición: 1A. ed.Descripción: 935; 24.8.Tema(s): COMUNICACIONES DIGITALES - MEDICIÓNClasificación CDD: 621.382.DERI.00
Contenidos:
CHAPTER 1 FUNDAMENTALS OF DIGITAL COMMUNICATIONS SYSTEMS . -- CHAPTER 2 JITTER BASICS . -- CHAPTER 3 SERIAL COMMUNICATION SYSTEMS AND MODULATION CODES . -- CHAPTER 4 BIT ERROR RATIO TESTING . -- CHAPTER 5 BERT SCAN MEASUREMENTS . -- CHAPTER 6 WAVEFORM ANALYSIS-REAL-TIME SCOPES . -- CHAPTER 7 CHARACTERIZING HIGH-SPEED DIGITAL COMMUNICATIONS SIGNALS AND SYSTEMS WITH THE EQUIVALENT-TIME SAMPLING OSCILLOSCOPE . -- CHAPTER 8 HIGH-SPEED WAVEFORM ANALYSIS ALL-OPTICAL SAMPLING . -- CHAPTER 9 CLOCK SYNTHESIS,PHASE LOCKED LOOPS, AND CLOCK RECOVERY . -- CHAPTER 10 JITTER TOLERANCE TESTING . -- CHAPTER 11 SENSITIVITY TESTING IN OPTICAL DIGITAL COMMUNICATIONS . -- CHAPTER 12 STRESS TEST IN HIGH-SPEED SERIAL LINKS . -- CHAPTER 13 MEASUREMENTS ON INTERCONNECTS . -- CHAPTER 14 FRECUENCY DOMAIN MEASUREMENTS . -- CHAPTER 15 JITTER AND SIGNALING TESTING FOR CHIP-TO-CHIP I/O LINK COMPONENTS AND SYSTEMS . -- APPENDIX A PSEUDO-RANDOM BINARY SEQUENCES . -- APPENDIX B PASSIVE ELEMENTS FOR TEST SETUPS . -- APPENDIX C COAXIAL CABLES AND CONNECTORS . -- APPENDIX D SUPPLEMENTAL MATERIALS FOR CHAPTER 3 . -- INDEX
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CHAPTER 1 FUNDAMENTALS OF DIGITAL COMMUNICATIONS SYSTEMS

. -- CHAPTER 2 JITTER BASICS

. -- CHAPTER 3 SERIAL COMMUNICATION SYSTEMS AND MODULATION CODES

. -- CHAPTER 4 BIT ERROR RATIO TESTING

. -- CHAPTER 5 BERT SCAN MEASUREMENTS

. -- CHAPTER 6 WAVEFORM ANALYSIS-REAL-TIME SCOPES

. -- CHAPTER 7 CHARACTERIZING HIGH-SPEED DIGITAL COMMUNICATIONS SIGNALS AND SYSTEMS WITH THE EQUIVALENT-TIME SAMPLING OSCILLOSCOPE

. -- CHAPTER 8 HIGH-SPEED WAVEFORM ANALYSIS ALL-OPTICAL SAMPLING

. -- CHAPTER 9 CLOCK SYNTHESIS,PHASE LOCKED LOOPS, AND CLOCK RECOVERY

. -- CHAPTER 10 JITTER TOLERANCE TESTING

. -- CHAPTER 11 SENSITIVITY TESTING IN OPTICAL DIGITAL COMMUNICATIONS

. -- CHAPTER 12 STRESS TEST IN HIGH-SPEED SERIAL LINKS

. -- CHAPTER 13 MEASUREMENTS ON INTERCONNECTS

. -- CHAPTER 14 FRECUENCY DOMAIN MEASUREMENTS

. -- CHAPTER 15 JITTER AND SIGNALING TESTING FOR CHIP-TO-CHIP I/O LINK COMPONENTS AND SYSTEMS

. -- APPENDIX A PSEUDO-RANDOM BINARY SEQUENCES

. -- APPENDIX B PASSIVE ELEMENTS FOR TEST SETUPS

. -- APPENDIX C COAXIAL CABLES AND CONNECTORS

. -- APPENDIX D SUPPLEMENTAL MATERIALS FOR CHAPTER 3

. -- INDEX

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