DIGITAL COMMUNICATIONS TEST AND MEASUREMENT: HIGH-SPEED PHYSICAL LAYER CHARACTERIZATION - ED 1. / 2007
Por: DERICKSON , DENNIS | [Autor].
Colaborador(es): MULLER, MARCUS.
Editor: USA ; PRENTICE HALL ; 2007Edición: 1A. ed.Descripción: 935; 24.8.Tema(s): COMUNICACIONES DIGITALES - MEDICIÓNClasificación CDD: 621.382.DERI.00Tipo de ítem | Ubicación actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
---|---|---|---|---|---|---|---|
Libros | Biblioteca Central | BIBCE-CSING (Biblioteca Central - 1er piso) | 621.382.DERI.00 (Navegar estantería) | 1e. | Disponible | 60272 |
CHAPTER 1 FUNDAMENTALS OF DIGITAL COMMUNICATIONS SYSTEMS
. -- CHAPTER 2 JITTER BASICS
. -- CHAPTER 3 SERIAL COMMUNICATION SYSTEMS AND MODULATION CODES
. -- CHAPTER 4 BIT ERROR RATIO TESTING
. -- CHAPTER 5 BERT SCAN MEASUREMENTS
. -- CHAPTER 6 WAVEFORM ANALYSIS-REAL-TIME SCOPES
. -- CHAPTER 7 CHARACTERIZING HIGH-SPEED DIGITAL COMMUNICATIONS SIGNALS AND SYSTEMS WITH THE EQUIVALENT-TIME SAMPLING OSCILLOSCOPE
. -- CHAPTER 8 HIGH-SPEED WAVEFORM ANALYSIS ALL-OPTICAL SAMPLING
. -- CHAPTER 9 CLOCK SYNTHESIS,PHASE LOCKED LOOPS, AND CLOCK RECOVERY
. -- CHAPTER 10 JITTER TOLERANCE TESTING
. -- CHAPTER 11 SENSITIVITY TESTING IN OPTICAL DIGITAL COMMUNICATIONS
. -- CHAPTER 12 STRESS TEST IN HIGH-SPEED SERIAL LINKS
. -- CHAPTER 13 MEASUREMENTS ON INTERCONNECTS
. -- CHAPTER 14 FRECUENCY DOMAIN MEASUREMENTS
. -- CHAPTER 15 JITTER AND SIGNALING TESTING FOR CHIP-TO-CHIP I/O LINK COMPONENTS AND SYSTEMS
. -- APPENDIX A PSEUDO-RANDOM BINARY SEQUENCES
. -- APPENDIX B PASSIVE ELEMENTS FOR TEST SETUPS
. -- APPENDIX C COAXIAL CABLES AND CONNECTORS
. -- APPENDIX D SUPPLEMENTAL MATERIALS FOR CHAPTER 3
. -- INDEX
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